Flash Sale ! Bruker DektakXT Stylus Profilometer Unit only USD $6890.00

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Condition : New

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Specifications :

• Stylus: Diamond tip with selectable force (1-15 mg), options for different radii (e.g., 2µm, 12.5µm).
  
• Vertical Measurement:
  
• Range: Up to 1 mm (1000 µm).
  
• Resolution: 1 Å (0.1 nm) at 6.55 µm range.
  
• Repeatability: < 4Å (1 sigma) on ≤1 µm steps.
  
• Scan Capabilities:
  
• Scan Length: 55 mm standard, with stitching for up to 200 mm (8-inch) scans.
  
• Data Points: Up to 120,000 per scan.
  
• Stage: Motorized X/Y stage, 360° rotation, supports up to 200mm wafers/samples.
  
• Imaging: Integrated color camera with selectable magnification.
  
• Features: 3D mapping, automation, soft materials mode, environmental enclosure.